Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures.
Chikara HamanakaRyosuke YamamotoJun FurutaKanto KubotaKazutoshi KobayashiHidetoshi OnoderaPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2011)