A computationally efficient unified approach to the numerical analysis of the sensitivity and noise of semiconductor devices.
Giovanni GhioneFabio FilicoriPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
- numerical analysis
- computationally efficient
- semiconductor devices
- image enhancement
- noise immunity
- arbitrary shape
- random noise
- noise reduction
- signal to noise ratio
- noise level
- electron beam
- noise removal
- finite difference
- sensitivity analysis
- noisy data
- median filter
- gaussian noise
- image noise
- noise model
- image processing
- high sensitivity
- cloud computing
- computational complexity