Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling.
Federico AlimentiGuendalina SimonciniGianluca BrozzettiDaniele Dal MaistroMarc TieboutPublished in: IEEE Access (2020)
Keyphrases
- millimeter wave
- radar images
- metal oxide semiconductor
- physical phenomena
- imaging process
- sar imagery
- silicon on insulator
- noise level
- high density
- solar cell
- mixed signal
- additive noise
- three dimensional
- false alarms
- low power
- noise reduction
- signal to noise ratio
- computer graphics
- image data
- object recognition
- multiscale