Image-Based Defect Detection in Assembly Line with Machine Learning.
Giovanni BurresiMartino LorussoLisa GrazianiAlice ComacchioFederico TrottaAntonio RizzoPublished in: MECO (2021)
Keyphrases
- defect detection
- assembly line
- machine learning
- assembly line balancing
- beam search
- computer vision
- production line
- processing times
- feature extraction
- manufacturing systems
- precedence constraints
- multiple objectives
- feature selection
- orders of magnitude
- supervised learning
- reinforcement learning
- learning algorithm