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A BiCMOS active substrate probe-card technology for digital testing.
Masoud Zargari
Justin Leung
S. Simon Wong
Bruce A. Wooley
Published in:
IEEE J. Solid State Circuits (1999)
Keyphrases
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digital media
cost effective
digital technologies
multimedia
rapid development
smart card
image processing
test set
data processing
low cost
case study
computer systems
st century
databases
circuit design
digital imaging
digital world
point of sale