A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation.
Chieh-Pu LoWen-Zhang LinWei-Yu LinHuan-Ting LinTzu-Hsien YangYen-Ning ChiangYa-Chin KingChrong Jung LinYu-Der ChihTsung-Yung Jonathon ChangMeng-Fan ChangPublished in: IEEE J. Solid State Circuits (2019)