High performance control of atomic force microscope for high-speed image scanning.
M. S. RanaHemanshu Roy PotaIan R. PetersenPublished in: ICARCV (2012)
Keyphrases
- high speed
- image features
- image classification
- image analysis
- input image
- image data
- image retrieval
- image representation
- single image
- multiscale
- template matching
- image content
- segmentation method
- vector field
- region of interest
- image collections
- image segmentation
- segmentation algorithm
- high resolution
- image processing
- feature points
- control system
- pixel values
- microscope images
- laser scanning
- hough transform
- spatial information
- image matching
- similarity measure
- image set
- scanned images
- external forces