SCANNED IMAGES
Experts
- Faisal Shafait
- C. V. Jawahar
- Chew Lim Tan
- David S. Doermann
- Thomas M. Breuel
- Basilios Gatos
- Umapada Pal
- Jun Sun
- Venu Govindaraju
- Jean-Marc Ogier
- Dimosthenis Karatzas
- Satoshi Naoi
- Stavros J. Perantonis
- Rafael Dueire Lins
- Kaushik Roy
- Nibaran Das
- Ioannis Pratikakis
- Utpal Garain
- Qiang Huo
- Hirobumi Nishida
- Amrith Krishna
- Shijian Lu
- Ram Sarkar
- A. G. Ramakrishnan
- Seiichi Uchida
- Graham Leedham
- Jan P. Allebach
- S. Abirami
- Masakazu Suzuki
- Xu Huang
- Chandana Dinesh Parape
- Hiroaki Takebe
- Joost van Beusekom
- Atul Negi
- Ching Y. Suen
- Thierry Paquet
- Katsuhito Fujimoto
- Gaofeng Meng
- Htwe Pa Pa Win
Venues
- ICDAR
- CoRR
- Sensors
- ICIP
- DRR
- Int. J. Document Anal. Recognit.
- IEEE Trans. Image Process.
- Document Analysis Systems
- IEEE Access
- ICPR
- Pattern Recognit.
- J. Electronic Imaging
- ICFHR
- ICMV
- Color Imaging Conference
- ICIP (3)
- ICVGIP
- ISCAS
- ICASSP
- CVPR
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Multim. Tools Appl.
- PICS
- IET Image Process.
- IEEE SENSORS
- ICDAR Workshops (2)
- Int. J. Pattern Recognit. Artif. Intell.
- MVA
- ICIAR
- Document Recognition
- ICIP (2)
- ICME
- Pattern Anal. Appl.
- ICPR (2)
- ACIVS
- IWFHR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IQSP
- WACV
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