A method of thermal testing of microsystems.
Piotr BratekAndrzej KosPublished in: Microelectron. Reliab. (2001)
Keyphrases
- evaluation method
- detection method
- experimental evaluation
- high accuracy
- fully automatic
- optimization method
- cost function
- pairwise
- mathematical model
- clustering method
- main contribution
- support vector machine svm
- similarity measure
- objective function
- test data
- optimization algorithm
- computational cost
- prior knowledge
- evolutionary algorithm
- computationally efficient
- preprocessing
- error rate
- face recognition
- dynamic programming
- significant improvement