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Neural Network Assisted Compact Model for Accurate Characterization of Cycle-to-cycle Variations in 2-D $h$-BN based RRAM devices.

Jacob N. RohanPingping ZhuangS. S. Teja NibhanupudiSanjay K. BanerjeeJaydeep P. Kulkarni
Published in: DRC (2019)
Keyphrases