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The Impact of Temperature and Switching Rate on Dynamic Transients of High-Voltage Silicon and 4H-SiC NPN BJTs: A Technology Evaluation.
Saeed Jahdi
Mohammad Hedayati
Bernard H. Stark
Phil H. Mellor
Published in:
IEEE Trans. Ind. Electron. (2020)
Keyphrases
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high voltage
operating conditions
low cost
data sets
expert systems
cmos technology
high temperature
normal operation