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Design and implementation of an atomic force microscope with adaptive sliding mode controller for large image scanning.

Yuan-Zhi PengJun-Wei WuKuan-Chia HuangJyun-Jhih ChenMei-Yung ChenLi-Chen Fu
Published in: CDC/ECC (2011)
Keyphrases
  • edge detection
  • image analysis
  • multiscale
  • real time
  • neural network
  • stability analysis