Login / Signup
Modeling collinear WATs for parametric yield enhancement in semiconductor manufacturing.
Chen-Fu Chien
Peng-Chieh Lee
Runliang Dou
Ying-Jen Chen
Chia-Cheng Chen
Published in:
CASE (2017)
Keyphrases
</>
semiconductor manufacturing
discrete event simulation
image processing
process control
artificial neural networks
production system
straight line
learning algorithm
search engine
decision trees
control system
image enhancement
dynamic systems
modeling framework