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Critical path identification and delay tests of dynamic circuits.

Kyung Tek LeeJacob A. Abraham
Published in: ITC (1999)
Keyphrases
  • critical path
  • job shop scheduling problem
  • dynamic environments
  • neural network
  • similarity measure
  • bayesian networks
  • scheduling problem
  • high speed
  • simulated annealing
  • power consumption
  • benchmark problems