Test pattern generation for circuits with tri-state modules by Z-algorithm.
Noriyoshi ItazakiKozo KinoshitaPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
- matching algorithm
- preprocessing
- high speed
- dynamic programming
- detection algorithm
- k means
- improved algorithm
- experimental evaluation
- convergence rate
- selection algorithm
- theoretical analysis
- expectation maximization
- computational complexity
- optimal solution
- probabilistic model
- np hard
- simulated annealing
- cost function
- segmentation algorithm
- objective function
- learning algorithm
- single pass
- hardware implementation
- recognition algorithm
- convex hull
- times faster
- path planning
- significant improvement
- search space
- image sequences