An all-digital built-in-self-test scheme for duty cycle corrector with de-skew circuit in NAND Flash memory.

Ya Hai Fei Liu Yongshan Wang Jing Kang

Published in: Microelectron. J. (2023)

Keyphrases

flash memory
duty cycle
garbage collection
solid state
file system
random access
buffer management
main memory
embedded systems
disk drives
real time
database systems
b tree
data storage
storage devices
small size
storage systems
databases
memory management
high speed
low cost
data model