Identification of Dominant Noise Source and Parameter Sensitivity for Substrate Coupling.
Emre SalmanEby G. FriedmanRadu M. SecareanuOlin L. HartinPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
- noise immunity
- noise level
- random noise
- missing data
- noisy data
- signal to noise ratio
- parameter settings
- input parameters
- noise model
- sensitivity analysis
- high sensitivity
- parameter values
- multiple sources
- automatic identification
- noisy images
- noise reduction
- regularization parameter
- noise removal
- additive noise
- image sequences