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A Hierarchical Test Methodology for Systems on Chip.
Jin-Fu Li
Hsin-Jung Huang
Jeng-Bin Chen
Chih-Pin Su
Cheng-Wen Wu
Chuang Cheng
Shao-I Chen
Chi-Yi Hwang
Hsiao-Ping Lin
Published in:
IEEE Micro (2002)
Keyphrases
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high speed
learning systems
computing systems
trading systems
expert systems
intelligent systems
database
real time
clustering algorithm
multiscale
low cost
complex systems
hierarchical structure