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A Hierarchical Test Methodology for Systems on Chip.

Jin-Fu LiHsin-Jung HuangJeng-Bin ChenChih-Pin SuCheng-Wen WuChuang ChengShao-I ChenChi-Yi HwangHsiao-Ping Lin
Published in: IEEE Micro (2002)
Keyphrases
  • high speed
  • learning systems
  • computing systems
  • trading systems
  • expert systems
  • intelligent systems
  • database
  • real time
  • clustering algorithm
  • multiscale
  • low cost
  • complex systems
  • hierarchical structure