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Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Yannick WengerBernd MeinerzhagenVadim Issakov
Published in: IEEE Access (2024)
Keyphrases
  • built in self test
  • millimeter wave
  • integrated circuit
  • radar images
  • physical phenomena
  • sar imagery
  • imaging process
  • multiscale
  • image data
  • denoising
  • automatic target recognition