Reliability and Robustness Performance of 1200 V SiC DMOSFETs.

Siddarth Sundaresan Vamsi Mulpuri Jaehoon Park Ranbir Singh

Published in: IRPS (2020)

Keyphrases

high robustness
real time
data sets
real world
reliability analysis
database
decision trees
artificial neural networks
probability distribution
computational efficiency