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Reliability and Robustness Performance of 1200 V SiC DMOSFETs.

Siddarth SundaresanVamsi MulpuriJaehoon ParkRanbir Singh
Published in: IRPS (2020)
Keyphrases
  • high robustness
  • real time
  • data sets
  • real world
  • reliability analysis
  • database
  • decision trees
  • artificial neural networks
  • probability distribution
  • computational efficiency