Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis.
Dong XiangShan GuHideo FujiwaraPublished in: Asian Test Symposium (2003)
Keyphrases
- data analysis
- data sets
- statistical analysis
- data collection
- data processing
- databases
- data acquisition
- synthetic data
- raw data
- image data
- input data
- data structure
- computer systems
- training data
- experimental data
- original data
- empirical data
- data sources
- knowledge discovery
- high quality
- database systems
- closed loop
- controller design