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Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs.
Tejasvi Das
Clyde Washburn
P. R. Mukund
Steve Howard
Ken Paradis
Jung-Geau Jang
Jan Kolnik
Jeff Burleson
Published in:
VLSI Design (2005)
Keyphrases
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prediction accuracy
rapid development
case study
multi dimensional
data processing
radio frequency
input data
prediction error
technological advances
feature selection
information technology
cost effective
prediction model
key technologies
prediction algorithm