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Ultra-High Repetition Rate Terahertz Time-Domain Spectroscopy for Micrometer Layer Thickness Measurement.

Kevin KolpatzeckXuan LiuLars HäringJan C. BalzerAndreas Czylwik
Published in: Sensors (2021)
Keyphrases
  • ultra high
  • data handling
  • frequency domain
  • high resolution
  • x ray
  • infrared
  • application layer
  • multi layer
  • databases
  • cross section
  • sampling rate
  • data sets
  • machine learning
  • growth rate
  • single layer