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Deep Learning-Based Integrated Circuit Surface Defect Detection: Addressing Information Density Imbalance for Industrial Application.

Xiaobin WangShuang GaoJianlan GuoChu WangLiping XiongYuntao Zou
Published in: Int. J. Comput. Intell. Syst. (2024)
Keyphrases
  • industrial applications
  • integrated circuit
  • deep learning
  • defect detection
  • probabilistic model
  • domain specific