Automated wafer-level measurement of LDMOS reverse recovery parameters.
Jose A. Rodriguez LatorreManuel A. JimenezRogelio PalomeraPublished in: MWSCAS (2012)
Keyphrases
- integrated circuit
- databases
- semi automated
- input parameters
- input data
- data driven
- levels of abstraction
- higher level
- parameter space
- parameter values
- lower level
- automated analysis
- parameter selection
- fully automated
- parameter settings
- sensitivity analysis
- maximum likelihood
- expert systems
- clustering algorithm
- knowledge base
- machine learning