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Testing from Partial Deterministic FSM Specifications.

Alexandre PetrenkoNina Yevtushenko
Published in: IEEE Trans. Computers (2005)
Keyphrases
  • finite state machines
  • high level
  • formal specification
  • delay insensitive
  • databases
  • information systems
  • test set
  • software testing
  • real time
  • neural network
  • real world
  • website
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  • test cases
  • black box