Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach.
Marco RigamontiPiero BaraldiEnrico ZioAllegra AlessiDaniel AstigarragaAinhoa GalarzaPublished in: Microelectron. Reliab. (2016)
Keyphrases
- self organizing maps
- field effect transistors
- high density
- neural network
- steady state
- competitive learning
- unsupervised learning
- som neural network
- learning vector quantization
- input data
- mathematical analysis
- probabilistic neural network
- growing self organizing map
- topology preserving
- k means
- object recognition
- multiscale
- image processing
- computer vision