X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology.

Ashrith S. Harith Yingdi Liu Nilanjan Mukherjee Jeffrey Mayer

Published in: VLSID (2024)

Keyphrases

data processing
cost effective
logic programming
case study
rapid development
digital libraries
logic programs
key technologies
design tools
logical framework
built in self test