LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects.

Krishna Sekar Sujit Dey

Published in: VTS (2002)

Keyphrases

built in self test
low cost
low power
hardware and software
integrated circuit
logic programming
input output
lower cost
embedded systems
real time
highly efficient
detection scheme
data acquisition
high speed
automated reasoning
single chip
hardware software co design
data sets