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Characterization of vertically aligned carbon nanofibers grown on Ni dots nanoelectrode array using Atomic Force Microscopy.

Zhuxin DongUchechukwu C. WejinyaImad H. ElhajjM. Meyyappan
Published in: IROS (2009)
Keyphrases
  • atomic force microscopy
  • real time
  • low energy
  • programmable logic
  • linear array
  • carbon dioxide
  • axiomatic characterization
  • database
  • machine learning
  • three dimensional
  • multiscale
  • multiresolution
  • high speed