A method for finding the background potential of quantum devices from scanning gate microscopy data using machine learning.
Carlo R. da CunhaNobuyuki P. AokiDavid K. FerryYing-Cheng LaiPublished in: Mach. Learn. Sci. Technol. (2022)
Keyphrases
- synthetic data
- machine learning
- input data
- test data
- data analysis
- data sets
- statistical methods
- noisy data
- prior information
- training samples
- prior knowledge
- image data
- machine learning methods
- missing data
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- similarity measure
- training data
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- bayesian methods
- spectral clustering
- objective function
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- neural network
- method finds