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Circuit Reliability Comparison Between Stochastic Computing and Binary Computing.

Zuodong ZhangRunsheng WangZhe ZhangYawen ZhangShaofeng GuoRu Huang
Published in: IEEE Trans. Circuits Syst. (2020)
Keyphrases
  • high speed
  • real time
  • information systems
  • data sets
  • databases
  • neural network
  • machine learning
  • search algorithm
  • statistical analysis
  • jump diffusion process