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Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs.

A. SasikumarA. R. ArehartD. W. CardwellC. M. JacksonW. SunZ. ZhangS. A. Ringel
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • deep learning
  • metal oxide
  • real time
  • databases
  • neural network
  • machine learning
  • genetic algorithm
  • computational complexity
  • power consumption
  • changing environment