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Partial scan test for asynchronous circuits illustrated on a DCC error corrector.

Marly Roncken
Published in: ASYNC (1994)
Keyphrases
  • asynchronous circuits
  • error rate
  • model checking
  • delay insensitive
  • process algebra
  • data sets
  • neural network
  • test data
  • database
  • real time
  • databases
  • error bounds
  • scan data