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Layout design and verification for cell library to improve ESD/latchup reliability in deep-submicron CMOS technology.

Ming-Dou KerJeng-Jie Peng
Published in: CICC (1998)
Keyphrases
  • layout design
  • low power
  • cmos technology
  • inter cell
  • model checking
  • spl times
  • mixed signal
  • low voltage
  • power consumption
  • computer vision
  • moving objects
  • low cost
  • high speed