Systematic Yield Improvement in Board Testing Practice.
Earl DaltonWalter AhernStephen DenkerKen SweitzerBill CooperTom KellyStan SmithPublished in: ITC (1986)
Keyphrases
- test cases
- real world
- practical significance
- significant improvement
- wide range
- image processing
- trade off
- multiresolution
- test set
- database
- social networks
- decision making
- knowledge base
- artificial intelligence
- learning environment
- information technology
- information retrieval
- object oriented
- data mining
- widely accepted