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Microrobot System for Automatic Nanohandling inside a Scanning Electron Microscope.

Sergej FatikowThomas WichHelge HülsenTorsten SieversMarco Jähnisch
Published in: ICRA (2006)
Keyphrases
  • scanning electron microscope
  • semi automatic
  • artificial intelligence
  • neural network
  • computer vision
  • three dimensional
  • search space
  • image analysis
  • labor intensive