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NUV-Enhanced 4H-SiC SACM APDs.

Jonathan SchusterMichael A. DerengeJeremy L. SmithGregory A. GarrettDaniel B. HabersatBrenda VanMilDina M. BowerShahid AslamTilak HewagamaMichael WrabackAnand V. Sampath
Published in: DRC (2024)
Keyphrases
  • least squares
  • neural network
  • learning algorithm
  • computer vision
  • pattern recognition
  • multiresolution
  • data points
  • single image