Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network.
YuanFu YangMin SunPublished in: CoRR (2022)
Keyphrases
- pattern classification
- neural network
- pattern recognition
- probabilistic neural network
- fuzzy classifier
- nearest neighbor rule
- radial basis function neural network
- pattern classification problems
- feature extraction
- neural network model
- back propagation
- feed forward
- mass spectrometry data
- artificial neural networks
- decision boundary
- knn
- multilayer perceptron
- bp neural network
- self organizing maps
- nearest neighbor
- feature selection
- machine learning