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Addressing the IEEE AV Test Challenge with Scenic and VerifAI.
Kesav Viswanadha
Francis Indaheng
Justin Wong
Edward Kim
Ellen Kalvan
Yash Pant
Daniel J. Fremont
Sanjit A. Seshia
Published in:
CoRR (2021)
Keyphrases
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test data
machine learning
genetic algorithm
feature selection
web services
three dimensional
database systems
bayesian networks
multiscale
statistical significance