Software defect prediction techniques using metrics based on neural network classifier.
R. JayanthiM. Lilly FlorencePublished in: Clust. Comput. (2019)
Keyphrases
- software defect prediction
- sample selection bias
- ensemble learning
- neural network
- feature ranking
- multi layer perceptron
- feature selection
- imbalanced data
- artificial neural networks
- generalization ability
- class imbalance
- ensemble methods
- genetic algorithm
- ensemble classifier
- neural network model
- training data
- classification algorithm
- training process
- fault diagnosis
- misclassification costs
- support vector machine
- cost sensitive
- random forest
- gene selection
- bp neural network
- back propagation
- unlabeled data
- feature extraction
- feature subset selection
- fold cross validation
- svm classifier
- linear classifiers