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A Metric-Learning-Based Nonlinear Modeling Algorithm and Its Application in Key-Performance-Indicator Prediction.
Yunqiang Duan
Min Liu
Mingyu Dong
Published in:
IEEE Trans. Ind. Electron. (2020)
Keyphrases
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distance metric
metric learning
learning algorithm
similarity measure
k means
expectation maximization
data mining
machine learning
feature selection
semi supervised
image classification