Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference.
Monika Elisabeth HeringhausYi ZhangAndré ZimmermannLars MikelsonsPublished in: Sensors (2022)
Keyphrases
- bayesian inference
- prior information
- probabilistic model
- variational inference
- bayesian model
- particle filter
- statistical inference
- hyperparameters
- hierarchical bayesian
- variational bayes
- markov chain monte carlo
- probabilistic modeling
- parameter settings
- gibbs sampler
- information extraction
- prior distribution
- hidden variables
- bayesian models