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Surface Simplification using Intrinsic Error Metrics.

Hsueh-Ti Derek LiuMark GillespieBenjamin ChislettNicholas SharpAlec JacobsonKeenan Crane
Published in: ACM Trans. Graph. (2023)
Keyphrases
  • error metrics
  • geometric structure
  • error measure
  • d objects
  • wavelet synopses
  • multiresolution
  • surface reconstruction
  • maximum error
  • absolute error
  • image segmentation
  • high quality
  • wavelet transform