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Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory.

Giusy LamaMathieu BernardNicolas BernierGuillaume BourgeoisEmmanuel NolotNiccolo CastellaniJulien GarrioneMarie Claire CyrilleGabriele NavarroEtienne Nowak
Published in: IRPS (2021)
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