Effect of Post Annealing on the Electrical Characteristics and Deep Level Defects of Ga2O3/SiC Heterojunction Diodes.
Dong-Wook ByunMin-Yeong KimSoo-Young MoonMyeongcheol ShinMichael A. SchweitzSang-Mo KooPublished in: ESSDERC (2022)
Keyphrases
- simulated annealing
- genetic algorithm ga
- genetic algorithm
- neural network
- physical characteristics
- levels of abstraction
- multi objective
- evolutionary algorithm
- search space
- higher level
- fitness function
- scheduling problem
- case study
- information systems
- genetic operators
- parameter set
- search algorithm
- monte carlo
- evolutionary computation
- hybrid algorithm
- deep learning
- printed circuit boards
- data sets