On the Complexity of Wafer-to-Wafer Integration.

Guillerme Duvillié Marin Bougeret Vincent Boudet Trivikram Dokka Rodolphe Giroudeau

Published in: CIAC (2015)

Keyphrases

semiconductor manufacturing
integrated circuit
massively parallel
machine learning
artificial intelligence
computational complexity
expert systems
manufacturing process
genetic algorithm
learning environment
np hard
information integration