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Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures.
Krzysztof Piskorski
Henryk M. Przewlocki
Vikram Passi
Jasper Ruhkopf
Max C. Lemme
Published in:
MIXDES (2018)
Keyphrases
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geographic information systems
test data
semiconductor manufacturing
database
databases
data sets
neural network
image sequences
image analysis
spatial data
spatial databases
data modeling
thin film
spatial reasoning
measurement noise
field effect transistors