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Fail Pattern Identification for Memory Built-In Self-Repair.
Rei-Fu Huang
Chin-Lung Su
Cheng-Wen Wu
Shen-Tien Lin
Kun-Lun Luo
Yeong-Jar Chang
Published in:
Asian Test Symposium (2004)
Keyphrases
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associative memory
pattern matching
main memory
memory requirements
automatic identification
memory space
computing power
data sets
databases
machine learning
image processing
data structure
memory usage
low memory