YALEB
Experts
- Marcos Faúndez-Zanuy
- Stan Z. Li
- Martin de La Gorce
- Jean-Luc Dugelay
- Gwangbin Bae
- Virginia Espinosa-Duro
- Charlie Hewitt
- Xudong Jiang
- Jingjing Shen
- Daijin Kim
- Shekhar Karanwal
- Yong Man Ro
- Tadas Baltrusaitis
- Jirí Mekyska
- Roberto Cipolla
- Dong Chen
- Jian Zhang
- Annalisa Franco
- Sujing Wang
- Ming Shao
- Zuodong Yang
- Nicholas Bacci
- Gajanand Sharma
- Eunju Kim
- Heeseung Choi
- Rajendra S. Gad
- Yangsheng Wang
- Jyothi Gudavalli
- Joshua Davimes
- Juyoung Lee
- Qiyun Cai
- C. Y. N. Dwith
- Ze Lu
- Matti Pietikäinen
- Hyeran Byun
- G. N. Rathna
- Gérard G. Medioni
- Gi Pyo Nam
- Mahek Shah
Venues
- CoRR
- CVPR Workshops
- ICASSP
- BIOSIG
- ICPR
- FG
- Pattern Anal. Appl.
- ESANN
- J. Circuits Syst. Comput.
- Signal Process. Image Commun.
- CIARP
- SSPR/SPR
- ISM
- Multim. Tools Appl.
- IEEE Access
- J. Electronic Imaging
- UEMCON
- NCVPRIPG
- AMFG
- Sensors
- IP&C
- Cogn. Comput.
- WACV
- BioMS
- ICVGIP Workshops
- ICIP (1)
- F1000Research
- IEEE Trans. Syst. Man Cybern. Part B
- ICSI (2)
- APSIPA
- ICIAP
- SINOBIOMETRICS
- ICME
- PDCAT
- FFER@ICPR
- AIAI
- Systems and Computers in Japan
- ICIP
- J. Comput. Aided Mol. Des.
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